|
|  |
Silicon Dioxide
| SiO2
White Powder |
|
Typical Technical Data:
|
|
Characterization Techniques
|
| Specific Surface Area m2/g |
35 ± 5
|
Argon absorption desorption (BET) |
| Average Particle Size, nm |
70 ± 5 |
Calculated from SSA
|
| Particle Shape |
Spherical |
TEM |
| Crystallographic Phases |
X-ray amorphous |
XRD |
Chemical Composition,
Impurities |
Fe max. 0,05 |
Chemical analysis |
| Ca max. 0,01 |
Chemical analysis |
| N2
max. 0,01 |
Chemical analysis |
Content of metallic impurities is determined by purity of raw material.
|