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|  |
Silicon Nitride - Yttrium Oxide
| Si3N4
- Y2O3
Light Grey Powder |
|
Typical Technical Data:
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|
Characterization Techniques
|
| Specific Surface Area m2/g |
60 ± 5
|
Argon absorption desorption (BET) |
| Average Particle Size, nm |
30 ± 5 |
Calculated from SSA
|
| Particle Shape |
Unregular |
TEM |
| Crystallographic Phases |
a-, ß-, X-ray amorphous Si3N4
- Y2O3 |
XRD |
| Chemical Composition |
*N min. 34,5 |
Chemical analysis |
| *Y 7,5 ± 0,2 |
Chemical analysis |
| Sifr
max.0,8 |
Chemical analysis |
| Metallic Impurities |
Fe max. 0,05 |
Chemical analysis |
| Ca max. 0,01 |
Chemical analysis |
| Al max. 0,01 |
Chemical analysis |
* By customer's desire.
Content of metallic impurities is determined by purity of raw
material.
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